Sizing in Phased Array Technique using Diffraction and Amplitude Displacement
This report shows the results of an experimental work carried out with the aim to improve defect analysis and sizing of both volumetric and planar defects, detected and imaged with the phased array probe technique. The phased array technique produces S-scan type images of defects which put easily in evidence the structure of the relevant echo indications. Depending of defect morphology, we can see diffracted echoes from planar defects, and also secondary echoes (improperly considered as diffracted echoes), generated by a complex conversion mode process, from volumetric ones. We can see also single indications, when defect height is comparable with ultrasonic wavelength or its complex geometry destroy diffracted or secondary indications, and, finally, we can see clustered indications. Thus we have to recognize such different image structures in order to apply the most suitable sizing procedure. The obtained results are very satisfactory and allow us to be more confident in apply phased array technique.
G. Nardoni M. Certo P. Nardoni
I&T Nardoni Institute
国际会议
第十七届世界无损检测会议(17th World Conference on Nondestructive Testing)
上海
英文
3935-3941
2008-10-25（万方平台首次上网日期，不代表论文的发表时间）