Defect detection of Al specimen of using Lock-in photo-infrared thermography technique.
Over the years, Infrared thermography (IRT) has been used as a non destructive testing methods of the various kinds of materials. This technique has many merits and applied to the industrial field but has limitation to the materials. Therefore, this method was combined with lock-in technique. So IRT detection resolution has been progressively improved using lock-in technique. In accordance with this paper describes location of subsurface defects and measurement resolution in the Al s and SUS plates by using Lock-in photo-infrared thermography technique. In lock-in thermography, a phase difference between the defect area and the healthy area indicates the quantitative location and size of the defects. The results obtained from two kinds of specimens Al6061-T6 and SUS304 are compared the thermal diffusivity differences. It measures the resolution of the defect detection of Al 6061-T6 specimen.This result may be used for life time estimation of the object and measurement of resolution of IRT of the defect material. Experimental results for SUS and Al plate with artificial subsurface defect show good agreement with actual values.
Lock-in IR camera penetration depth defect resolution thermal diffusion
Koung-suk KIM Seung-pil YANG Sung-sik KIM Ki-soo Kang Hyun-min KIM Min-kwen KIM
Dept. of Mechanical Design Engineering Chosun University 375 Seosuk dong, Dong-Gu Gwangju, 501-759, Dept. of Ophthalmic Optics Dong-a College, Dokcheon-ri Haksan-myeon, Yeongam-gun,Jeollanam-Do, Rep o Dept. of Mechatronics Mok-po science college, Mokpo-si, Jeollanam-Do, Rep of Korea KRISS 102 Yuseong, Daejeon 305-600, Korea Graduate School, Chosun University, Gwangju, Gwj, Rep of Korea
国际会议
第十七届世界无损检测会议(17th World Conference on Nondestructive Testing)
上海
英文
3860-3865
2008-10-25（万方平台首次上网日期，不代表论文的发表时间）