A breakthrough in high-speed digital eddy current testing technology
Legacy eddy current devices largely depend on an analog signal processing chain. Severe limitations towards speed, multiplexability and accuracy are imposed by these analog front ends. A new generation of eddy current testing instruments is presented, which alleviates these restrictions by using a FPGA-based fully digital signal processing chain. Speed, accuracy and the ability for complex an fast multiplexing operations are only some of the benefits reaped from using this novel approach. High speed applications, such as real-time inspection of railway tracks at speeds above 100km/h, inspection in high speed production lines like in wire production, high speed sorting and high speed probe multiplexing become possible.
NDT Eddy Current High-Speed
Aschwin M. GOPALAN Martin JUNGER Rohmann GmbH
Rudolf-Diesel-Strasse 13, 67227 Frankenthal, GERMANY
国际会议
第十七届世界无损检测会议(17th World Conference on Nondestructive Testing)
上海
英文
2183-2186
2008-10-25（万方平台首次上网日期，不代表论文的发表时间）