Optimization of structure and operation algorithms for electromagnetic plated coatings thickness meters with the use of digital technologies
Rapid progress in microcontrollers with the developed structure of hardware and software means, as well as the integrated fast operating analog to digital and digital to analog converters allowed one to pose a problem of thickness meters development excluding entirely or practically entirely the analog circuits in the exciting circuits and conversion of primary measuring information with the use of digital test methods ensuring a considerable improvement of metrological properties. The article is devoted to development of principles for constructing impulse inductive plated coatings thickness meters providing a full offset from the coating electro-conductivity action, high-frequency and power supply noises excluding temporary and temperature drift based on the use of digital technologies.
coatings thickness meter converter induction
Vladimir A. Syasko Alexander S. Bulatov Ivan S. Pivovarov
Constanta LTD Pob 89, St-Petersburg, 198095, Russia
国际会议
第十七届世界无损检测会议(17th World Conference on Nondestructive Testing)
上海
英文
2041-2045
2008-10-25（万方平台首次上网日期，不代表论文的发表时间）