LOW FREQUENCY ACOUSTIC (IMPEDANCE) FLAW DETECTORS OF THE NEW GENERATION AND THEIR APPLICATION
Multilayer constructions and objects made of polymer composite materials have found its application in aviation and space industries. Low-frequency acoustic methods are widely used for inspection, viz impedance and free oscillation method. RII MSIA Spectrum has designed and has been manufacturing the AD-42IP and AD-64M flaw detectors operating on the basis of the above methods. AD-42IP is the development of the impulse impedance flaw detectors AD-42I and AD-42IM. Its distinguishing feature is digital signal processing. The power of received signal, Db, is under monitoring. This is a portable device with battery power supply that allows inspection in hard-to-reach zones and closed space. To decrease power consumption we monitor the contact between the probe and an object that stops excitation of oscillation. Basic parameters and oscillogram are displayed. The on-screen menu assists adjustment, previous operational parameters are stored automatically and an operator can start the inspection at once. The received signal can be stored and transferred to PC via IR unit. AD-64M is a computerized system that comprises an electronic unit and PC connected to that via USB interface. Modifications feature the connection with a pocket PC via Bluetooth interface. AD-64M also employs the method of free oscillations that allows inspection of objects with soft external elements. Spectral data processing is used. The difference between the current and reference spectrum serve for a flaw. It enhances the sensitivity and informativeness. The device features many service options: storage, processing and representation of data and inspection parameters. The above devices are certified and applied to inspect parts of aeronautical and space engineering (rotor and oar blades, plain elements and skin), pipeline isolation and others.
acoustic impedance flaw detection low frequency
Vladimir F. MUZHITSKY Andrey M. SYSOEV Alexey G. EFIMOV
JSCSpectrum-RII, Moscow, Russia
国际会议
第十七届世界无损检测会议(17th World Conference on Nondestructive Testing)
上海
英文
406-414
2008-10-25（万方平台首次上网日期，不代表论文的发表时间）