会议专题

X-RAY THICKNESS GAGES OF THE RIT10 FAMILY FOR THICKNESS MEASUREMENT AT LINE PRODUCTION OF ROLLED METAL

When inspecting the thickness of rolled metal with the use of thickness gauges we cannot obtain the true value of thickness. That means the measurement gives us only an approximate value. This is explained by both precision consideration in principle of the thickness gauge and the nature of the inspected material. The accuracy of thickness gauge is a characteristic that shows the degree of approximation of test indication to the true value of thickness. It correlates with physical phenomena that the device is based on, its schematic circuit and the tolerance of individual units of the gauge. The key disadvantage of the X-ray technique in thickness measurement is difficult interpretation of readings, namely the conversion of radiation attenuation in material into its thickness. According to the current Russian standard, the variation in metal density and its chemistry is not taking into consideration when measuring. To compensate this and to eliminate its influence on the measurement accuracy, we offered a new scheme for the X-ray thickness gauge design (patents 22152601, 2215259, ...). In the whole we have patented more than 20 designs of the RIT10 Xray thickness gauges that have allowed us to improve the accuracy in comparison with the design with conventional arrangement of the emitter and detector of X-ray radiation. It resulted in the increase of product yield. For analytical research we used the base scheme of gauge arrangement in test points of technological process. We theoretically analyzed the influence of metal chemistry variation on gauge interference with the use of samples of cross and longitudinal crown in rolled metal from all stages of metal processing and the data on rolled metal chemistry. Today it is impossible to draw a line between the X-ray method and the radioscopy method 1, since both employ new equipment that uses digital conversion for primary signal processing. To represent radiometric control data, such equipment uses not only the numerical but also graphic values of a measured parameter (charts, graphs etc.) which drastically facilitates data perception. The X-ray method is primarily represented by X-ray thickness gaging that allows thickness of rolled metal with the effective atomic number of material Z = 12....72 to be effectively measured accurate within micron fractions to a few centimeters, such measurement performed in process without interfering with the technology cycle.

X-ray method thickness measurements emitter detector ionizing chamber

Boris V. ARTEMIEV Alexander I. MASLOV

JSC Spectrum-RII, Moscow, Russia

国际会议

第十七届世界无损检测会议(17th World Conference on Nondestructive Testing)

上海

英文

37-43

2008-10-25(万方平台首次上网日期,不代表论文的发表时间)