Transmission electron microscopy for materials science:new developments and breakthrough applications
This study firstly highlights the latest new developments in modem transmission electron microscopy (TEM).These include through-focus exit-wavefunction reconstruction (TF-EWR)in highresolution TEM (HRTEM),HRTEM with a spherical aberration (Cs)corrector for the objective lens,highresolution electron energy-loss spectroscopy (HREELS)with a monochromator,high-resolution scanning TEM (HRSTEM)with a Cs-corrector for the condense lens,and dynamic TEM.Then by examples,I show how these new electron microscopic techniques have led to some breakthroughs in solving key problems in materials science,as well as in nanoscience.
Chen Jianghua
Center for High-resolution Electron Microscopy,College of Materials Science and Engineering,Hunan University,Yuelu Hill,Changsha 410082,China National Center for HREM,Department of Nanoscience,Delft University of Technology,Lorentzweg 1,2628 CJ Delft,The
国际会议
上海
英文
897-898
2008-09-26（万方平台首次上网日期，不代表论文的发表时间）