Simulation of the Reliability of Semiconductor Laser Initiated Device

摘要：

In the present paper the simulation method of function reliability of laser initiated device (LID) system is studied. The reliability of LID system based on three-way LID system is analyzed. A simulation program is written, and the function reliability of LID system is simulated by the program. The results show that systemic reliability of LID system is great effect on the LID. The maximum no-fire stimulus and minimum all-fire stimulus of the LID system is calculated in the paper.

关键词： initiating explosive device reliability laser initiated system simulation

作者: ZHANG Rui LI Fang LI Geng

作者单位: National Key Laboratory of Applied Physics-Chemical, Shaanxi Applied Physics-Chemistry Research Inst National Key Laboratory of Applied Physics-Chemical, Shaanxi Applied Physics-Chemistry Research Inst

会议类型: 国际会议

会议名称: 2007国际推进剂、炸药、烟火技术秋季研讨会(The 2007 International Autumn Seminar on Propellants,Explosives and Pyrotechnics)

会议地点: 西安

会议语种:英文

页码: 727-730

在线出版日期: 2007-10-23（万方平台首次上网日期，不代表论文的发表时间）