Micro-structural Analysis of Pt-doped WO3 Film Sensitive to Hydrogen
Using the method of Sol-gel with a combination of magnetron sputtering, we get two samples of pure Tungsten trioxide (WO3) film and Pt-doped WO3 film. The experiments of sensitivity to hydrogen demonstrate that Pt-doped WO3 film perform significantly better than pure WO3 film. Using X-ray diffraction and Atomic Force Microscopy (AFM), we analyze two samples and get that the crystallization temperature of Pt-doped WO3 film is a bit higher than that of pure WO3 film. The surfaces of Pt-doped sample and pure sample show loose and porous state from AFM-images, and the former is smoother than the latter. Appropriate doping can provide more electrons (or holes) for the materials and strengthen the surface activity, playing a catalytic role. This is the first time to analyze the properties sensitive to hydrogen of WO3 films according to their microstructure.
WO3 film Doping Sensitivity to hydrogen XRD Micro-structure
刘安平 王银峰
重庆大学数理学院应用物理系,400044
国际会议
成都
英文
2007-11-19（万方平台首次上网日期，不代表论文的发表时间）