The EMC and Reliability Design of Memorized Measuring System

摘要：

In this paper, the overall design scheme, EMC design and measuring method are introduced for memorized measuring equipment. To the question appeared in the testing we show the improved measurement. Consequently, the reliability of this system can be validated.

关键词： Memorized Measuring System，EMC，Reliability

作者: 方媛 马游春 李锦明

作者单位: 电子测试技术国家重点实验室 中北大学

会议类型: 国际会议

会议名称: 第六届中国国际纳米科技研讨会

会议地点: 成都

会议语种:英文

在线出版日期: 2007-11-19（万方平台首次上网日期，不代表论文的发表时间）