Simulation Structure of Expert System Aided Testability Integrated Design of Electro-equipments

摘要：

In general, testability design and analysis of electro-equipments mainly include testability prediction, testability allocation, testability demonstration, and testability assessment and so on. However, these research items have not been widely incorporated. Therefore, great attention must be paid to testability integrated design (TID) in depth. This paper introduces application of artificial intelligence on TID. It gives simulation structure of expert system aided testability integrated design of electro-equipments (ESTID). Furthermore, the paper makes a brief analysis of the domain of TID, the concept and objectives of TID in depth. At last, on the basis of the above research, the paper presents application of system to help understand ESTID how to run and gives a simple example to illustrate the above procedure.

关键词： testability integrated design artificial intelligence expert system simulation system

作者: LIU Jimin YU Yongli QI Zhijun LIANG Weijie

作者单位: Maintenance Engineering Institute, Ordnance Engineering College, Shijiazhuang, 050003 Shijiazhuang Center Hospital, Shijiazhuang, 050010

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）