N-Detection Test Generation with Clustering and Estimation of Distribution Algorithms: a preliminary research

摘要：

We introduce a procedure for n-detection test sets generation based on Clustering and Estimation of Distribution Algorithms (CEDAs). Estimation of Distribution Algorithms (EDAs) could analyze the interrelations between the circuits primary inputs through the joint probability distribution effectively. Based on this circuits structure information, the test schemas of fault activation and propagation are expected to be captured and carried over to the new test patterns. Data clustering as preprocessing for EDAs enhance the efficiency and effectiveness of test generation procedure. Preliminary experimental results on the benchmark circuits demonstrate the feasibility of this procedure.

关键词： N-Detection estimation of distribution algorithm test generation clustering

作者: PENG Xi-yuan ZHAO Zhong-yu PENG Yu

作者单位: Dept of Automatic Test and Control Harbin Institute of Technology,Science Park of Harbin Institute of Technology, P.O.Box 3033,Harbin Heilongjiang China, 150080

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）