Research on a Design Method of Parallel Test System

摘要：

Parallel test has become a new technology with the rapid development of automatic test system in order to reduce test time and cost. The general design idea of parallel test system is introduced at first in this paper. The system general planning is described. And the system hardware and software design are analyzed in detail.

关键词： parallel test multithread ATS

作者: SHEN Yuhao FU Zhenhua GU Zhaobing MA Chunlei WANG Yu

作者单位: Department of Missile Engineering, Machine Engineering College, Shijiazhuang, 050003

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）