The Research of PCB Interconnect Test Generation Algorithm Based on Boundary Scan

摘要：

Usually according to the different information used in the test generation algorithm, test algorithm can be separated into three types: traditional boundary scan test algorithm, structural interconnect test algorithm based on the information of circuit board and boundary scan adaptive test algorithm. In the paper, the above three kinds of test algorithm are introduced in detail, some algorithms are compared from the two symbols which indicate the test algorithm good or not: compact index based on the test time and the complete index based on the diagnostic capability including aliasing syndrome phenomenon and the confounding syndrome phenomenon. At last, the research trends of the boundary scan test algorithm are forecasted.

关键词： boundary-scan optimization algorithm compact index complete index

作者: REN Zheping YANG Jie NIU Chunping DING Shiyong

作者单位: The Academy of Armored Force Engineering, Beijing, 100072, China The No.528 military representatives office, Yangzhou, China

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）