Research of Testability Design and Analysis Technology Facing Concurrent Engineering

摘要：

Based on the discussion of traditional serial testability design and combined with principle of concurrent engineering, a study was made upon how to think over concurrently the products testability design in the stage of product design. The information model of products testability was established at the same time. It gives a design scheme of testability design and analysis system for products based on concurrent engineering in the paper, and it also analyses the key technologies to realize the system.

关键词： design for testability concurrent engineering testability model.

作者: HUANG Kao-li LIAN Guang-yao JIANG Yu-hai GUO Rui

作者单位: The 4th Department, Ordnance Engineering College, Shijiazhuang, 050003 China Section of PLA Representation in 447 Factory, Baotou, 014033, China

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）