The Magnetic Memory Examination Signal Processing Based on Wavelet Analysis

摘要：

This paper presents the wavelet analysis theory applied to processing magnetic memory examination signal. By eliminating noise, checking the irregularity and withdrawing, as well as suppressing frequency sector, the flaw time domain locates accurately and the gradient contrast effect is obvious. It provides a new method for magnetic examination evaluation.

关键词： Magnetic Memory Examination Wavelet Analysis Irregularity Examination Gradient

作者: Yu Runqiao Luo Shuiyun Wang Longwen

作者单位: Key Laboratory of Non-Destructive Test Ministry of Education, Nanchang Institute of Aeronautical Technology, Nanchang, 330063, China

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）