Sub-pixel Edge Detection Based on Local second Moment

摘要：

Edge detection is an important pre-processing technology of image processing. This paper proposes a method for sub-pixel edge location based on the local second moment （LSM ）. Using the local Similarity of the pixels gray feature, the edge feature measurement based on the LSM is advanced. This paper analyzes the distribution change characteristic of LSM according to the sub-pixel edge location model, detects the edges with the local maximum value of LSM and extracts the sub-pixel edge position with conic fitting. Finally the results of simulation experiment verify that this method can extract the accurate sub-pixel edge position and it is easy for real-time processing and implement.

关键词： edge detection Sub-pixel edge location local similarity local second moment

作者: Zheng Jian Xu Lixin Cui Zhangzhong Liu Qingling

作者单位: Beijing Institute of Technology,Beijing 100081,China

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）