Design of Miniature Transient State Superhigh Temperature Test and Measurement System

摘要：

This article mainly introduced the miniature transient state superhigh temperature test and measurement system design and the realization; It elaborated the miniature test system overall project design and the hardware realization method combining the overall system function composition diagram and the system hardware diagram. Based on technology request which matches high temperature test of the weapon development process and all kinds of specified technical specification which achieved anticipant, it elaborated design principle and several key technologies of the superhigh temperature test system. The overall system was controlled by the FPGA, and it was realized though the VHDL language. Finally through the experiment, it was confirmed that this design system had characteristics of high precision, working stability, etc.

关键词： transient state superhigh temperature FPGA test and measurement system VHDL1

作者: ZHANG XueYan ZHANG YanJun ZHEN GuoYong

作者单位: Key Laboratory of Instrumentation Science & Dynamic Measurement (North University of China), Ministry of Education Department of Electronic Science and technology, North university of China, Taiyuan, 030051

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）