EMC Design and Test of Memorized Measuring Equipment

摘要：

In the paper, the test and normal request of EMC (Electromagnetic compatibility) is overall introduced and analyzed for memorized measuring equipment. The testing methods of EMC are presented in detail. To the question appeared in the testing, we analyze it1 from design aspect, study it from theory aspect and show improved measurement from the occur mechanism of EMI (electromagnetic interference). Consequently, the interferential headstream is solved and the pathway transferring interference is switched off.

关键词： EMC EMI Storage test

作者: Ma Youchun Fang Yuan Li Jinming Guo Huifang

作者单位: Department of Electronic Science and technology, North university of China, Taiyuan, 030051 China

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）