A Computer-aided Sigma Delta A/D Converter Testing Method

摘要：

Oversampled Sigma Delta A/D converters are widely used today in real life because of the high resolution with comparatively simply circuits. With the development of modern technology, high accuracy A/D converters performance specification and performance evaluation become more and more important. But the test of the high resolution Sigma Delta A/D converter is very difficult. This paper promoted a novel computer-aided Sigma Delta A/D converter testing method based on spectral analysis using fast Fourier transformer(FFT). A 16-bit stereo audio Sigma Delta A/D converter is tested. It consists of two identical fifth-order switched capacitor Sigma Delta modulators, bandgap circuits, a decimation digital filter and highpass filter. The hardware/software testing environment has been established. The primary test results of the chip are successfully optained.

作者: ChenLei ZhaoYuanfu Jiangshuang Xiao Du

作者单位: Northwestern Polytechnical University, Xian, ShanXi, 710072;Beijing Microelectronics Technology In Beijing Microelectronics Technology Institute, BeiJing, 100076

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）