Green Design for Testability Allocation Model of Complicated Electronic Equipment
Synthesizing present DFT techniques, structures, and approaches, relationships during deferent levels of testability guidelines of complicated electronic equipments are analyzed according to hierarchical testability model. Considering influences coming from reliability, maintainability and safety etc fully, testability allocation model of complicated electronic equipments is given. The model embodies the thought of green design. It is consistent with integrated design framework of electronic equipments. The computer aided testability allocation tool based on this model is strictly dependent on existing DFT standards. It is compatible with the rest of computer aided design tools of electronic equipments. Meanwhile, the result figured out from the model is easy to be achieved and suitable for management during life cycle of equipments.
DFT testability allocation model green design life cycle
WANG Baolong HUANG Kaoli WEI Zhonglin GUO Rui
Department of Missile Engineering, Ordnance Engineering College, Shijiazhuang, 050003 China Section of PLA Representation in Beijing, Beijing, 100854, China
国际会议
北京
英文
2007-08-05（万方平台首次上网日期，不代表论文的发表时间）