会议专题

Design of B Scan and Display in Ultrasonic Thickness Gauge

Firstly, structure of hardware and framework of program of Ultrasonic thickness gauge with measured thickness data and wave is introduced, which is composed of ARM chip and TFT LCD. Method of Brightness modulation scan and display (B scan and display) by hand movement is given to show cross section shape of measured work piece. Basing on requirements of application, contents of B scan and display is designed, moreover, contents of B scan and display are detailed and explained. Then several types of B display window are designed and two types of B display window is chosen as program interface. Finally, measuring experiment is carried to show actual effect of B scan and display.

ultrasonic thickness gauge brightness modulation measured work piece B display window program interface

SUN Lei ZHU Jihong PENG Xuelian XU Xigang

Computer Science & Technology of Tsinghua University 1 Instrument R&D Department of Time Group INC. Computer Science & Technology of Tsinghua University, Haidian District, 100084, Beijing, CHINA Instrument R&D Department of Time Group INC #38 Shangdi, West Road, Haidian District, 100085, Beijin

国际会议

第七届国际测试技术研讨会

北京

英文

2007-08-05(万方平台首次上网日期,不代表论文的发表时间)