Electrical Derivative Characteristics of High Power Laser Diodes

摘要：

An equivalent circuit model is presented for high power laser diodes (LDs) in order to investigate the DC characteristics, and hence the theoretical electrical derivative (IdV/dI) expression is derived. Several low power and high power LDs are measured to investigate IdV/dI characteristics, and the parameters of IdV/dI are examined and characterized, respectively. Comparison of experimental and theoretical results provides both qualitative and quantitative information, which can be used to estimate the reliability of high power LDs nondestructively.

关键词： laser diode electrical derivative reliability nondestructive test

作者: ZHANG Shuang GUO Shuxu GAO Fengli CAO Junsheng SHAN Jiangdong YU Siyao

作者单位: College of Electronic Science and Engineering, Jilin University of China, Changchun, 130012,

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）