Study on Reliability of Semiconductor Lasers and Laser Arrays Using the Method of Electrical Derivative1

摘要：

A test system has been established on the basis of PC (NI-DAQ inside) to give fast and nondestructive tests for high power semiconductor LDs and LD arrays whose work current is 0-45A. The system can measure V-I, IdV/dI-I, P-I, dP/dI-I etc. of LDs or LD arrays and provide parameters such as threshold current, equivalent series resistance, characteristic parameter of junction, junction voltage saturation parameter etc. to evaluate the quality and reliability of the devices. The relationship between the electrical derivative parameters and the devices reliability was discussed. Moreover, the uniformity of LD arrays elements was focused on to study the reliability of LD array. The method to describe the uniformity quantificationally was also discussed.

关键词： semiconductor laser laser array reliability nondestructive test electrical derivative1

作者: CAO Junsheng GUO Shuxu GAO Fengli ZHANG Shuang YU Siyao SHI Jiawei

作者单位: College of Electronic Science and Engineering, Jilin University, Changchun 130012, China

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）