New Phase Measurement Profilometry Using Fringe Projection

摘要：

A new phase measurement profilometry based on fringe projection is presented, which combines the phase-shifted fringe patterns and a centerline pattern to determine the absolute phase of the object, A conversion algorithm is then used to convert the absolute phase to the x,y,z coordinates of the object surface, To determine the unwrapping phase of the object, a projected gray code fringe pattern is proposed to calculate the jump phase 2 π*n, which can measure the object existing large height steps and/or spatially isolated surfaces. The validity of this method is verified experimentally.

关键词： phase shift fringe projection absolute phase 3-D measurement centerline

作者: LI Wenguo LV Qiujuan

作者单位: State Key Lab for Manufacturing Systems Engineer, Institute of Precision Engineering, Xian Jiaotong State Key Lab for Manufacturing Systems Engineer, Institute of Precision Engineering, Xian Jiaotong

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）