Study on the Design of Embedded Test System Based on DSP

摘要：

With the development of microelectronic technology, industry technology, the weapon system such as aircraft etc become more complex. At the Same time, it is more difficult to test and maintain. It is an effective measure to implement the real-time test and fault diagnosis by embedded test. The paper proposes a scheme of embedded test system based on DSP. And the concrete circuit scheme and the core chip of the serial communication and power are introduced. The software design is also introduced in the paper. The anti-interference is also the emphasis while designing the circuit.

关键词： Embedded test system DSP RS-232 CAN power

作者: LI Xuyuan XU Hualong WANG Xiaoquan ZI Xiangyong

作者单位: Xian Research Inst. of Hi-Tech Hongqing Town, Xian, P.R. China Xian, P.R. China

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）