Design of the Self-test Ability on the Versatile Electronic Equipment Auto Test System

摘要：

The self-test ability of ATS (Auto Test System) can effectively detect faults occurred in the system, which can significantly improve the reliability of the ATS. This paper describes the method of how to design and realize the self-test ability of the ATS, which includes how to construct the test items and program flow, software solution and design of self-test adapter.

作者: TIAN Xuguang CAI Jinyan CHEN Zefeng

作者单位: Department of Optical & Electrical Engineering, Ordnance Engineering College, Shijiazhuang, 050003 H Fire-control Lab of Technology Department, Baicheng Weapon Testing Center, Baicheng, 137001, Jilin,

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）