The Preparation and the Measurement of Thick Film Lead Zirconate Titanate

摘要：

Based on the thick film technology, and combining with the sol-gel technique, the pyroelectric thick film material, lead zirconate titanate (PZT), is prepared on the ceramic. Through the measurement of the topography, thickness, XRD, Raman, the performance of the film can be obtained. From the numerical value analyses of the Raman measurement, the crystal of the eight-layer film on the Pd-Ag electrode, which is sintered at 420 ℃ and annealed at 600 ℃, is the best one among the others.

关键词： lead zirconate titanate (PZT) pyroelectric Raman XRD sol-gel technology thick film technique

作者: KONG Fanhua XUE Chenyang Chen Lin Li Junhong Zhang Wendong

作者单位: Key Laboratory of Instrumentation Science & Dynamic Measurement (North University of China), Ministr Chemical Industry Department of North University of China, Taiyuan, 030051

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）