会议专题

Analog In-circuit Test Based on GPIB Instrument

The basic principles of Analog In-circuit Test are introduced in this paper, the Analog In-circuit Test system is built using the GPIB equipments, the methods of designing the software of the system is given, the errors of the test system are analyzed and the methods to decrease the errors are discussed.

in-circuit test GPIB instrument guarding technique MOA

Li Hongli Bai Yun Fu Hongwei

Air Force Engineering University, Xian, shannxi, 710051

国际会议

第七届国际测试技术研讨会

北京

英文

2007-08-05(万方平台首次上网日期,不代表论文的发表时间)