Analog In-circuit Test Based on GPIB Instrument

摘要：

The basic principles of Analog In-circuit Test are introduced in this paper, the Analog In-circuit Test system is built using the GPIB equipments, the methods of designing the software of the system is given, the errors of the test system are analyzed and the methods to decrease the errors are discussed.

关键词： in-circuit test GPIB instrument guarding technique MOA

作者: Li Hongli Bai Yun Fu Hongwei

作者单位: Air Force Engineering University, Xian, shannxi, 710051

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）