Design and Appliance of Semiconductor Refrigeration Control System in Improving Infrared Detection

摘要：

The semiconductor refrigeration principle was narrated briefly at first. The design of a semiconductor refrigeration temperature control system has been introduced, the design principle and circuit has presented. Then, we carried out a temperature test after design, and the result testify that the temperature control error was less than ±0.8 ℃. The test result shows that this control system can realize precise bidirectional thermostatic control of semiconductor refrigeration. The error analysis of the control system was discussed at last.

关键词： semiconductor refrigeration HgCdTe temperature control error analysis infrared detection

作者: Tan Qiulin Xue Chenyang Zhang Wendong Qin Haitao Xiong Jijun

作者单位: Key Laboratory of Instrumentation Science & Dynamic Measurement (North University of China), Ministry of Education National Key Laboratory for Electronic Measurement Technology Department of Electronic Science and technology, North university of China, Ta

会议类型: 国际会议

会议名称: 第七届国际测试技术研讨会

会议地点: 北京

会议语种:英文

在线出版日期: 2007-08-05（万方平台首次上网日期，不代表论文的发表时间）