A FEASIBILITY STUDY ON MICRO SILICON CANTILEVER BEAM FOR HIGH ISOLATION RF MEMS SWITCH
This paper presents a novel electrostatically actuated microelectromechanical switch. The structure of cantilever beam with electrodes sandwiched between Si and SiO2 layers has been established. Placing the pull-down electrodes outside the switching contact, the actuationvoltage can be reduced while keeping high contact force and restoration force. The top and bottom dielectric materials separated two conducting electrodes when actuated. Thus, the reliability and the performance of the switch have been greatly improved. The charts of thedeflection of the cantilever beam with respect to the voltage have been simulated with the MATLAB computer programming language.
MEMS switch high isolation cantilever beam silicon
Lingling Lin Feiyan Chen Guoqing Hu Wenyan Liu Baihai Wu
Depe.of Mechanical and Eiectrical Engineering,Xiamen University,Xiamen 361005,China Facuity of Eiectromechanical Engineering,Guangdong University of Technology,Guangzhou,China.;Mechani Mechanical Engineering College,Jimei University,Xiamen,China
国际会议
海南三亚
英文
2007-01-10(万方平台首次上网日期,不代表论文的发表时间)