SPATIO-TEMPORAL MAPPING OF TRANSIENT ELECTRIC FIELDS WITH AN ULTRAFAST SCANNING TUNNELING MICROSCOPE

摘要：

In this paper, we report experimental results of spatio-temporal mapping of electrical transients scanned in strip direction with an ultrafast scanning tunneling microscope. The transients are pumped by ultrashort laser pulses with duration of 100 fs and a wavelength of 800 nm on a coplanar strip line sample. The signals on a coplanar strip line were measured in both contact and non-contact mode. The resolved transient signal showed a full width at half maximum (FWHM) pulse width of 1.2 ps. The pulses propagate along the CPS at a speed of about 2/3 of the light velocity. The spatial resolution image of the gold surface on the transmission line acquired with the tip by the STM under ambient condition has a resolution on the order of 20 nm.

关键词： transient measurements ultrafast scanning tunneling microscope (USTM) spatio-temporal mapping

作者: Tian Lan Guoqiang Ni

作者单位: Department of Optoelectronic Engineering, School of Information Science and Technology, Beijing Institute of Technology, Beijing 100081, China

会议类型: 国际会议

会议名称: 2007年微纳系统集成及其商业化应用国际学术会议(2007 International Conference & Exhibition on Integration and Commercialization of Micro and Nano-Systems)

会议地点: 海南三亚

会议语种:英文

在线出版日期: 2007-01-10（万方平台首次上网日期，不代表论文的发表时间）