Transient Response Testing (TRT) of Intelligent Sensors Interface in Switched Current Technology

作者: jierong Guo Yigang He

作者单位: College of Electrical and Information Engineering Hunan University Changsha, Hunan 410082, China Ins College of Electrical and Information Engineering Hunan University Changsha, Hunan 410082, China

会议类型: 国际会议

会议名称: 第二届生物计算：理论及应用国际会议(The Second International Conference on Bio-Inspired Computing: Theories and Applications)

会议地点: 郑州

会议语种:英文

页码: 656-658

在线出版日期: 2007-09-14（万方平台首次上网日期，不代表论文的发表时间）