A SDG based method for detecting inherently unsafe factors of chemical process at conceptual design stage
Digraph-based causal models have been widely used to model the cause and effect behavior of process systems. Signed digraphs (SDG) capture the direction of the effect. It should be mentioned that there are loops in SDG generated from chemical process. From the point of the inherent operability, the worst unsafe factor is the SDG having positive loops that means any disturbance occurring within the loop will propagate through the nodes one by one and amplified gradually, so the system may lose control, which may lead to an accident. So finding the positive loops in a SDG and treating these unsafe factors properly can improve the inherent safety of a chemical process. This paper proposed a method that can detect the above mentioned unsafe factors in the process conceptual design stage automatically through the analysis of the SDG generated from the chemical process. A case study is illustrated to show how the algorithm works, and then a complicated case from industry is studied to demonstrate the effectiveness of the proposed algorithm.
SDG Inherent safety Conceptual design
WANG Hangzhou CHEN Bingzhen HE Xiaorong QIU Tong
Chemical Eng.Dept.,Tsinghua University,Beijing,100084,China
国际会议
西安
英文
2007-08-15（万方平台首次上网日期，不代表论文的发表时间）