The Effect of Cu on Ultrastructure of Wheat
Transmission Electron Microscope (TEM) was used to investigate the damage of wheat seedlings by copper and the distribution of Cu2+ in different parts of wheat seedlings was discussed. Experiment showed that Cu is more susceptible to migration than other metals in wheat cells. Needle dark electron dense particles were existed in leaves cells with 5mg/L Cu stressed. Swollen cristae in mitochondria were existed in cells with 50mg/L stressed, while mitochondria were almost disappear with 100mg/L stressed. Chloroplast increased in wheat leaves under low concentration Cu2+ stressed while swollen chloroplast and disrupted chloroplast membrane and cascade structure damaged of chloroplast stroma were existed under high concentration. The inference of Cu2+ on wheat root nucleolus was serious. Disruption of nuclear membrane, multi-vesicle nucleoplasm and agglutination of nucleus chromatin were appeared at root cells under 50mg/L Cu2+ and more serious damage were appeared under 100mg/L Cu2+.
Cu polluted Wheat seedlings Ultra structure
XIAO Xin FENG Qiyan DING Yi MENG Qinjun Zhang Shuang
China University of Mining and Technology, Xuzhou, China
国际会议
徐州
英文
89-92
2007-10-22（万方平台首次上网日期，不代表论文的发表时间）