Edge Detection Based on Multi-resolution Analysis in Cryo-electron Micrograph Images
Selecting hundreds of thousands of particles from low contrast and low SNR Cryo-electron micrograph (Cryo-EM)images is one of the major bottle-necks in advancing toward achieving atomic resolution reconstruction of biological macromolecules. To recognize true particles from impurities and other invalid particles, shape information plays a significant role.This paper provide a new method based on multi-resolution analysis to detect the main edges of objects in Cryo-EM image,which can be the pre-processing operations of next step ofparticle identification.
edge detection Cryo-electron micrograph multiresolution analysis wavelet decomposition particle-picking
Xiaorong Wu Xiaoming Wu Tiejun Yang
School of Computer Science and Engineering, South China University of Technology, Guangzhou P.R.Chin School of Biological Science and Engineering, South China University of Technology, Guangzhou P.R.Ch School of Computer Science and Engineering, South China University of Technology, Guangzhou P.R.Chin
国际会议
武汉
英文
356-359
2007-07-06(万方平台首次上网日期,不代表论文的发表时间)