Research on Conversion Relation Between Square Wave and ESD EMP in the Electromagnetic Damage of Electronic Devices

摘要：

By proceeding from micro electromagneticdamage function of the device, combining with domestic and foreign research achievement on square wave EMP damage, the relation between the damage data of square wave and it of ESD EMP is analyzed. The dependence among the damage data of square wave and it of ESD EMP is setup tentatively. Then, the conversion among damage voltage of square wave and it of ESD EMP is finished

关键词： Semiconductor electromagnetic damage ESD

作者: Zhang Rongqi Tan Zhiliang Xie Penghao

作者单位: Key Laboratory of Defense Science And Technology,mechanical Engineering College,Shijiazhuang 050003 China

会议类型: 国际会议

会议名称: 第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

会议地点: 西安

会议语种:英文

在线出版日期: 2007-08-16（万方平台首次上网日期，不代表论文的发表时间）