Research on System-level Automatic Metrology System for Aircraft Integrated Automatic Test Equipment

摘要：

In order to solve the problems in metrology supportfor aircraft integrated automatic test equipment ( IATE ), the paper proposes a set of system-level automatic metrology project. First, the paper analyzes aircraft integrated automatic test equipment test demands and hardware/software construction, works out system level metrology rules, clarifies system-level metrology parameters, range and uncertainty. Second, it puts forward a set of methods for IATE system-level metrology, composing verification standards and calibration regulations. Third, through the development on dedicated metrology modules and test program set (TPS), it designs a system-level automatic metrology system for a certain aircraft IATE. The application shows the system-level automatic metrology system can realize metrology support for the aircraft IATE effectively, ensure the accuracy, consistency and credibility of the IATE parameters, shorten metrology support duration, lower technical level of metrology support personnel.

关键词： system-level metrology automatic metrology verification calibration IATE parameters uncertainty

作者: Lee Qiongwei Fei Xiaojun

作者单位: Aero-instrument Test and Calibration Center,Beijing,China Test and Calibration Center,181#,Baipengyao,Fengtai,Beijing,100070,China

会议类型: 国际会议

会议名称: 第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

会议地点: 西安

会议语种:英文

在线出版日期: 2007-08-16（万方平台首次上网日期，不代表论文的发表时间）