A General Purpose Test Apparatus for High-Speed, High Resolution Analog to Digital Converters Based on IEEE Standard

摘要：

Nowadays high-speed, high resolution ADCs(Analog to Digital Converter) are employed in many fields, thus there exists an important task--how to test these ADCs, giving reliable results. This ADC test apparatus is based on the IEEE Std. It aims for the test of high speed, high resolution ADCs (16 bit at most, with the sample rate up to 166 MSPS and expandable) and the “General Purpose ability. This essay will present the basic techniques of ADC testing and the skills used in this apparatus, meanwhile giving the real test results of a commercial ADC for the illustration of its performance.

关键词： IEEE Std. USB nonlinearity SNR SFDR

作者: Zhao Lei Liu Shubin Li Yusheng An Qi

作者单位: The Key Laboratory of Physical Electronics,Anhui Province of China

会议类型: 国际会议

会议名称: 第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

会议地点: 西安

会议语种:英文

在线出版日期: 2007-08-16（万方平台首次上网日期，不代表论文的发表时间）