New Approach Based on Double-Crossed Step-down-Stress Accelerated Life Testing

摘要：

New approach based on DCSDS-ALT which is areverse process of traditional DCSUS-ALT is introduced. Procedure of this method is given, and numeral example is shown. Conclusions are that though DCSDS-ALT is not always better than DCSUS-ALT, its effect in improving testing efficiency is obvious when some product parameter reaches to certain value. For high reliability long lifetime test, this condition usually can be satisfied, so it is applicable.

关键词： Accelerated life testing step down stress Monte-Carlo simulation efficiency ratio

作者: Wang Yuming Cai Jinyan Jia Zhanqiang

作者单位: Ordnance Engineering College,Shijiazhuang 050003 China

会议类型: 国际会议

会议名称: 第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

会议地点: 西安

会议语种:英文

在线出版日期: 2007-08-16（万方平台首次上网日期，不代表论文的发表时间）