Resolution Test Technique and Influencing Factors Analysis of a Low-background Anti-Compton HPGe γ -ray Spectrometer

摘要：

This paper tests the resolutions under different high voltages, electronics and sources position of a low-background anti-Compton HPGe γ -ray spectrometer. The experimental results show that these factors have important influence on resolution. It is experimentally confirmed that the spectrometer can reaches at the best resolution of 1.77keV at a high voltage of 3250V under the condition of suited electronics and proper position of the source.

关键词： Resolution Test HPGe γ -ray spectrometer Influencing Factors

作者: Zhou Chunlin Xu Zhenhua Xu Congxue

作者单位: Xian Research Institute of Hi-Tech,Xian,shanxi,P.R.China 710025

会议类型: 国际会议

会议名称: 第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

会议地点: 西安

会议语种:英文

在线出版日期: 2007-08-16（万方平台首次上网日期，不代表论文的发表时间）