Test Sequencing Strategy with Imperfect Test

摘要：

In this paper, we consider imperfect test sequencing problem under a single fault assumption. Our approach is based on the comparing the imperfect test phenomenon to perfect test, and the integrating this phenomenon into the test sequencing strategy, called IPT-TS strategy. The results of numerical simulations on the test case show that the proposed approach significantly decreases test costs and is more adaptable to solve test sequencing problems with imperfect test for diagnosis when compared with that based on the random strategy.

关键词： test sequencing imperfect test fault diagnosis

作者: Wang Wei Yu Daren Hu qinghua

作者单位: Department of Energy Science and Engineering,Harbin Institute of Technology,Harbin 150001,China

会议类型: 国际会议

会议名称: 第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

会议地点: 西安

会议语种:英文

在线出版日期: 2007-08-16（万方平台首次上网日期，不代表论文的发表时间）