会议专题

A Comparison between LAN and GPIB Instrument Interfaces in a Automated Test System

For many years, GPIB has been the primary instrument Input/Output interface. However, new standards, such as LAN and USB, are gradually being built into modern instruments and test systems. This paper introduces the characteristics, advantages and disadvantages of using GPIB, LAN and USB interfaces in an automated test system. After that, a practical case using instruments with GPIB and LAN interfaces is analyzed, including the methodology developed for this study. It will also be discussed the possibilities to optimize production costs and a comparison between the used interfaces will be made, including the analyses of the system behavior when the instruments are controlled in parallel using different interfaces configurations, combining GPIB and LAN control. In the end of the paper, after the results achieved are presented and commented, conclusions are drown on the instrument architecture that best fits the requirements to optimize the automated test system is made.

IIS instrument interfaces GPIB LAN parallelism automated test system ATE

Leite Bruno Mota André

INdT – Nokia Institute of Technology,Manaus 69048-660 Brazil

国际会议

第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

西安

英文

2007-08-16(万方平台首次上网日期,不代表论文的发表时间)