Incorporating Design Research for Missile Testing in PXI Based on BIT and ATE
Progressively, Built-In Test (BIT) and Automatic Test Equipment (ATE), synthesizing design and application, become the effective approach to improve complex system testability and maintainability. Widely, PXI (PCI eXtensions for Instrumentation) is applied to the domain of automated test. Analyzed on the configuration of resource, module design, system design, compatibility design, tolerated error design, and so on, this paper presented the method on the BIT and ATE. This paper researched the test-launch control system for launch missiles, incorporating design in PXI bus based BIT and ATE. It presented the system level test structure figure, the circuit level test structure figure and the flow chart of software. The application of technology promotes the intelligentizing; generalizing and miniaturizing of the test-launch control system for launch missiles so as to improve the whole performance of missiles.
Built-in Test (BIT) Automated Test Equipment (ATE) PXI bus Boundary Scan Test-launch control
Jiang Hao Wang Xuemei Xue Yan Liu Binyou
Room 303 in Xian Research Inst.Of Hi-tech,Hongqing Town,Xian,710025 China
国际会议
西安
英文
2007-08-16（万方平台首次上网日期，不代表论文的发表时间）