An Defect Detection Method Based on Zernike Moments for Industrial CT Image
Industrial comput fault scan imaging is able to provide intuitive and clear images, without any overlapped pictures or geometrical distortion and it is widely used in nondestructive test. When we use industrial CT to conduct nondestructive test on defect and assembly error of batches of complicated workpiece, we meet some problems about distinguishing CT image with manual method, thus assembly defect detection method based on Zernike moments is put forward, which is identification method in two steps. Firstly, it uses rapid arithmetic to select a possible matched location through reliable method with a low amount of calculation. Secondly, it will conduct further estimation on matched location using Zernike Moments and then select accurate matched location. The test has indicated that selection method we adopted is feasible and it is effective to use Zernike Moments for the final judgment. This method is fairly helpful for detecting neglected-loaded accessories and error assembly location.
Defect Detection Zernike Moments Computed Tomography CT Image Fourier Transformation
Bi Guotang Chen Yuansong Qin Renchao Hu Wei
College of Computer Science & Technology,Southwest University of Science and Technology,Mianyang 621 Department of Computer Science & Engineering,Mianyang Normal University,Mianyang 621000 China
国际会议
西安
英文
2007-08-16（万方平台首次上网日期，不代表论文的发表时间）