Design of Equipment Fault Injection System Based on BIT

摘要：

At present, the microprocessor technology and micro-electronics technology are developing fast. The complication of equipment electronic system is improving continuously, so is the density of the circuits. Therefore, BIT (Built-in Test) has become a crucial element in solving fault diagnosis of equipment electronic systems. In order to design BIT effectively and evaluate its fault diagnosis ability, fault injection technology should be applied to the system to carry out the testability experiment. Aiming at the requirement of testability experiment for certain equipment, a fault injection system based on BIT is set up. The basic flow and theory about fault injection is expatiated on and the hardware frame of fault injection system is given.

关键词： fault injection built-in test testability

作者: Chang Qing Chen Jianhui

作者单位: Ordnance Engineering College,Shijiazhuang 050003 China

会议类型: 国际会议

会议名称: 第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

会议地点: 西安

会议语种:英文

在线出版日期: 2007-08-16（万方平台首次上网日期，不代表论文的发表时间）