Analogue Electronic Circuit Fault Diagnosis Based on Hierarchical Support Vector Machine and Dempster-Shafer Theory

摘要：

A fault diagnosis method for analog circuits based on Hierarchical Support Vector Machine (HSVM) and Dempster-Shafer (D-S) theory is developed in this paper. Firstly, output voltage signals from the test nodes are obtained from analog circuits test points and the fault feature vectors are extracted from haar wavelet transform coefficients. Then, after training the HSVM by faulty feature vectors, the HSVM model of the circuit fault diagnosis system is built. Finally, combing D-S theory with probabilistic interpretation of SVM scores estimate confidences over the prediction, which improves diagnosis results. Simulation results of diagnosing a four op-amp biquad high-pass filter circuit have confirmed the validity of the proposed technique.

关键词： HSVM D-S theory analogue circuit fault diagnosis

作者: Tang Jingyuan Shi Yibing Zhang Wei

作者单位: College of Automation,University of Electronic Science and Technology of China,Chengdu,610054,China

会议类型: 国际会议

会议名称: 第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

会议地点: 西安

会议语种:英文

在线出版日期: 2007-08-16（万方平台首次上网日期，不代表论文的发表时间）