Fast estimation of average leakage based on pre-characterizing standard cell

摘要：

In CMOS circuits, sub-threshold leakage (ISUB) has been an important issue during IC design. As technology keeps on scaling down, new leakage mechanisms such as bound to bound leakage (IB BTBT) and gate tunneling leakage (IGATE) cant still be neglected. Estimating the total leakage of a circuit at high level can help the designers to decide whether the design is eligible or should be modified. This paper introduced the main leakage mechanisms, including ISUBB, IBTBT and IGATE. The authors have also proposed a method to estimate the average leakage quickly based on pre-characterizing standard cell with BSIM models considering the new mechanisms. The results obtained by experiment on ISCAS benchmark circuits show that the method can be used to get the total leakage value and give a early direction for IC design.

关键词： Leakage cell

作者: Li Peng Tian Xi Nie Hongshan Yan Shaoshi

作者单位: National University of Defense Technology,Changsha 410073,China

会议类型: 国际会议

会议名称: 第八届国际电子测量与仪器学术会议(Proceedings of 2007 8th International Conference on Electronic Measurement & Instruments)

会议地点: 西安

会议语种:英文

在线出版日期: 2007-08-16（万方平台首次上网日期，不代表论文的发表时间）