Study on Interconnect Test Generation of MCM Based on Particle Swarm Optimization Algorithm and Genetic Algorithm

摘要：

The paper proposes a new interconnect test generation approach based on particle swarm optimization algorithm (PSO) and genetic algorithm (GA) for Multi-chip Module (MCM) applications. By combing the characteristics of interconnect test and constructing particle expression of test generation, the velocity updating equation and position updating equation of discrete PSO is presented in this paper.GA is employed to evolve the candidates generated by PSO,in order to improve the fault coverage of the test vector. The experimental results for MCM benchmark circuits show that the proposed algorithm can improve the performance of interconnect test generation in test set, fault coverage and CPU time when compared to other interconnect test generation algorithms.

作者: Lei Chen

作者单位: Guilin University of Electronic Technology, Guilin, Guangxi 541004, P.R.China

会议类型: 国际会议

会议名称: 第八届电子封装技术国际会议(2007 8th International Conference on Electronics Packaging Technology ICEPT2007)

会议地点: 上海

会议语种:英文

页码: 121-124

在线出版日期: 2007-08-14（万方平台首次上网日期，不代表论文的发表时间）