The Design of RFID Testing Channel Based on Direct Digital Synthesis Chip

摘要：

In recent years, radio frequency identification (RFID) technology has been widely used in many fields. Thus,how to reduce the price of testing RFID chip become a key problem which must be considered by chip manufacturer and test equipment supplier now. As an important part of carrier generator, direct digital synthesis chip play a key role in RFID testing system. In the paper, a new and economical design of RFID testing channel based on direct digital synthesis chip is discussed.

作者: Hong Ying-zheng Chen Wei

作者单位: Shanghai Fire Research Institute of Ministry of Public Secutity Shanghai, China

会议类型: 国际会议

会议名称: 2007年通信、电路与系统国际会议(2007 International Conference on Communications,Circuits and Systems Proceedings)

会议地点: 日本福冈

会议语种:英文

在线出版日期: 2007-07-11（万方平台首次上网日期，不代表论文的发表时间）